Lead-free surface finishes - a comparison of various
alternatives with HASL /
New developments in Organic Metal based Immersion Tin
Dr. Bernhard Wessling, Dr. Joerg Posdorfer
Ormecon Chemie
Ferdinand-Harten-Str. 7
D-22949 Ammersbek / Germany
mailbox@zipperling.hh.uunet.de
Tom Scimeca, Mike Scimeca, Brian McCoy
Florida CirTech, Inc.
Abstract: As the PCB industry moves toward a lead-free printed circuit board, critical decisions must be made regarding substitutes for processes that currently contain lead. Three very critical steps requiring a change from the current industry standard are:
(1) Final finish for the fabrication process to replace hot air solder
leveling (HASL).
(2) A lead-free alloy to replace the current tin/lead solder in wave machines at assembly.
(3) Solder pastes to replace those currently utilizing tin/lead solder powder.
This paper will compare the properties of lead free final finish
alternatives with respect to solderability as a function of a number of aging techniques.
The final finishes considered include Immersion Tin, Nickel/Gold, Silver, HASL and OSP.
Progress in Organic Metal based Immersion Tin will be described.
From the information provided in the paper, OEMs, PCB assemblers and PCB fabricators will
be able to determine which of the lead-free final finish alternatives is their best choice
which will help lead to the final goal of fabricating a lead-free fully assembled printed
circuit board.
for
basics, see IPC summit 1998, Austin, TX
1. Introduction
In the past few years, there has been an accelerated push in the search
for alternative printed circuit board final finish coatings. Typically, HASL has been used
as the final finish for well over a decade. However, the increased demands of surface
mount coplanarity with finer pitch surface mount pads has been the primary impetus in the
search for alternative coatings. Recent lead banning legislation has also gained momentum
and has accelerated the need for lead-free final finish alternatives.
The purpose of this study was to determine the the viability of lead-free final finishes
with respect to solderability as a function of a number of accelerated aging tests. In
this study, both the wettability and solder wicking are measured and compared among the
lead-free final finishes and referenced to the lead containing standard: Hot Air Solder
Leveling (HASL). The final finishes chosen include the following:
Hot Air Solder Leveling (HASL)
Organic Metal based Immersion Tin
Conventional Immersion Tin
Electroless Silver
Organic Solder Preservative (OSP)
Electroless Nickel / Immersion Gold
The ability of each final finish to address the various assembly and
bare board issues is shown in Table 1.
2. Experimental discussion and procedure
2.1 Sample preparation
All final finishes, with the exception of Organic Metal based Immersion
Tin, were prepared on Ormecon sample test boards or copper clad laminate from a number of
printed circuit board shops utilizing a given final final process. The ORMECON CSN final
finish was made at Ormecon in Germany according to standard procedures.
Table 1: Overview "Performance characteristics of Surface Finishes" (cf.
original paper)
After the etch surface preparation, the sample is immersed for 30 sec in Organic Metal
water dispersion PCB 7000, followed after the tin deposition in CSN 7001.
Accelerated aging
A number of different accelerated aging tests were performed on each final finish:
dry aging was done at 155 °C for 4 hours.
steam aging for 8 hours
at 65° C / 85% relative humidity (RH) and
at 85 °C / 85% RH performed at Trace Labs and Ormecon, resp..
unaged samples were subjected to three air reflow cycles.
Solderability tests
The first solderability test was to take a test board containing 16
small thru-holes, 24 medium size holes and 16 larger holes. The test board contains
varying sized surface mount pads as well. The board was coated with the final finish and
subjected to the various aging tests. Following this, the board was immersed in Florida
CirTechs SS-10 no-clean wave solder flux. The board was then used on a commercial
wave solder machine without any components to see if the solder would wick into the holes.
In the second solderability test, a small amount of Florida CirTech NC 611 no clean solder
paste was applied onto a copper clad coupon coated with the final finish subjected to the
various aging processes. In this case, the solder paste was printed in the form of a
circle with a diameter of 0.068 inches. The degree of solder paste spread as the paste
reflowed was then measured by photocopying the coupon and cutting out the area with solder
paste and weighing the paper with a very accurate scale (0.0001 gram sensitivity).
A novel solder paste spread test was also performed. In this case, 20 milligrams of NC 611
no clean solder paste was printed onto a small circle with the final finish surface. In
this case, the circle was connected to a 20 mil. wide 2.1 inch long trace, analogous to a
mercury thermometer. The greater the wetting, the greater the paste would be pushed along
the trace (higher temperature analogue).
Additionally, test coupons with the same final finishes were prepared and subjected to
identical aging. The thickness of each layer: surface oxides, surface tin and copper-tin
intermetallic species were measured by Selective Electrochemical Reduction (and Oxidation,
resp.) Analysis. These measurements were then correlated with wetting balance measurements
where the wetting force and wetting angle were both experimentally determined.
Discussion of results
The results of hole filling are shown in Table 2 and 5. A hole was
considered filled if the hole was more than 50% filled. In addition to hole filling, the
test boards contained two very large surface mount pads. In the case of steam aging, the
OSP and Ni/Au final finishes exhibited solder dewetting on these planes. This is
consistent with the low hole filling for these two final finishes with steam aging. In the
case of dry aging (155 °C for 4 hours), the OSP and Silver final finishes dewetted. While
the Silver still showed respectable solder wicking (95%) hole fill, the OSP was
unacceptable at 11%. In all other accelerated aging tests, all final finishes showed
acceptable wetting on the surface mount pads. Finally, the average of all six process
including the virgin final finishes was taken to give a better picture of the performance
of each final finish with respect to hole fill as a function of aging.
The second array of tests concerned the degree of solder paste spread on a bare copper
clad laminate coated with each final finish. The solder paste spread was measured by
weight and normalized to the weight of paper corresponding to a 0.068 inch diameter
circle. The solder spread results are shown in Table 3. In this case, numbers exceeding 1
would correspond to positive wetting and any number less than one would be negative
wetting or dewetting. A zero indicates complete dewetting as the solder paste minimizes
its surface tension by coalescing into a ball. Again, one can see that poor wetting
for Ni/Au is seen for steam aged boards and with OSP for dry aging. This is consistent
with the hole fill and dewetting results shown in table 2 and 5. Again, an average was
taken to illustrate the general wetting of each final finish averaged over all aged
processes.
The solder wetting were also measured by a new technique discussed above where the reflow
solder paste pushes the excess paste along a connected 20 mil trace of 2.1 inches in
length. The results of this tests are shown in Table 4. In this case, the 2.1 inch length
was multiplied by a factor of 1000 for simplification. One can see that HASL seems to push
more paste along the trace than any of the other alternative finishes. ORMECON is a
respectable second and the other finishes are well below this. Very little solder wetting
is seen for the OSP and Silver coatings.
Finally, wetting force and wetting angle measurements performed are shown in Table 5. In
this test, one can see that the wetting force, which measures instantaneous solder paste
wetting at reflow, is satisfactory for most cases. However, in the case of dry aging, both
OSP and Silver have no wetting force. Again, this is consistent with the poor hole filling
and dewetting results shown in table 2 and modest or poor solder paste wetting results
listed in tables 3 and 4. Solder force wetting numbers between 2 and 4 are probably not as
significant as the solder wetting angles results discussed next.
In the solder wetting angles, a higher angle is indicative of a greater degree of
dewetting. The higher the angle, the greater the interfacial tension. One can see that in
general, a greater solder wetting force is correlated with a lower solder wetting angle.
In addition, one sees a fairly high solder wetting angle as the final finishes are
subjected to aging. There are some other fairly general trends one can observe. Again, dry
aging is particularly difficult for the OSP and Silver finishes (>120 degrees). HASL
has a fairly consistent wetting angle regardless of aging and the immersion tins are also
relatively low. Ni/Au has an increasing wetting angle as this finish is subjected to aging
with steam aging in the area of 100 degrees.
Table 2 Hole filling as a function of aging and coating using no clean flux.
Tins |
||||||||
HASL |
OM-Tin |
FST |
Silver |
OSP |
CW |
NTU |
Dewetting? |
|
Virgin |
100 |
100 |
87 |
95 |
100 |
91 |
100 |
|
65/85 |
100 |
96 |
93 |
96 |
96 |
100 |
96 |
|
85/85 |
100 |
95 |
54 |
88 |
88 |
100 |
96 |
|
HASL |
OM-Tin |
FST |
Silver |
OSP |
CW |
NTU |
||
Steam |
98 |
98 |
91 |
89 |
79 |
48 |
43 |
OSP, Ni/Au |
Dry |
95 |
100 |
78 |
95 |
11 |
100 |
100 |
OSP, Ag |
| 3 Heat cycles | 100 |
89 |
82 |
91 |
91 |
100 |
98 |
|
Average |
99 |
96 |
81 |
92 |
78 |
90 |
89 |
|
Table 3 Solder paste spread as a function of aging and coating using no clean
solder paste
Tins |
||||||||
HASL |
OM-Tin |
FST |
Silver |
OSP |
Ni/Au(1) |
Ni/Au(2) |
||
Virgin |
1.26 |
1.72 |
1.28 |
1.12 |
0.97 |
1.4 |
1.12 |
|
65/85 |
1 |
1.25 |
0.75 |
1.04 |
1.03 |
1.15 |
1.04 |
|
85/85 |
1 |
1.21 |
0.9 |
0.9 |
1 |
1.06 |
0.94 |
|
HASL |
OM-Tin |
FST |
Silver |
OSP |
Ni/Au(1) |
Ni/Au(1) |
||
Steam |
1.07 |
1.16 |
1.31 |
1.01 |
1.09 |
0 |
0 |
|
Dry |
1 |
1.03 |
0.69 |
1.03 |
0 |
1 |
1.04 |
|
| 3 Heat cycles | 1.04 |
2.26 |
0.94 |
1 |
1.21 |
1.1 |
||
Average |
1.06 |
1.44 |
0.82 |
1.01 |
0.85 |
0.97 |
0.87 |
|
Table 4 Solder wetting as a function of aging and coating using no clean solder paste
Tins |
||||||||
HASL |
OM-Tin |
FST |
Silver |
OSP |
Ni/Au(1) |
Ni/Au(2) |
||
Virgin |
2100 |
1370 |
919 |
125 |
116 |
140 |
146 |
|
65/85 |
2100 |
500 |
429 |
120 |
108 |
117 |
120 |
|
85/85 |
690 |
277 |
330 |
88 |
75 |
121 |
147 |
|
HASL |
OM-Tin |
FST |
Silver |
OSP |
Ni/Au(1) |
Ni/Au(1) |
||
Steam |
1377 |
390 |
420 |
82 |
52 |
72 |
101 |
|
Dry |
1200 |
110 |
90 |
87 |
62 |
100 |
112 |
|
| 3 Heat cycles | 1730 |
809 |
87 |
68 |
178 |
103 |
||
Average |
1533 |
576 |
365 |
98 |
80 |
121 |
122 |
|
Comparison of different Immersion Tin finishes
Additional to the aging and wetting tests shown here, we have performed
an extensive study regarding the aging kinetics (under dry conditions). For this purpose,
aging was made at various different temperatures (between 50 and 170 °) for different
time. After this, the tin and intermetallic layer thickness was electrochemically
(oxidatively) measured, as well as the oxide layers by electrochemical reduction.
As can be seen in table 5, the conventional tin has quickly lost almost all of its tin
layer, and has grown significant amount of oxides. But as the tin chemistry is different
from ours, we have decided to compare here ORMECON CSN deposited with and without
pretreatment by the Organic Metal, in order to be able to directly determine the effect of
the use of the Organic Metal, which was earlier found to catalyze the tin deposition by a
clear one-electron process.
As the temperature and time conditions covered a broad enough range also close enough to
the real aging condition (at room temperature), we have been able to determine the
activation energy for the tin-into-copper diffusion and for the oxide development, and to
interpolate the kinetics for room temperature.
The surprising result is, that the velocity at which tin is lost or oxides are grown, is
not just only more or less higher for the tin deposited without the Organic Metal (as one
would expect from aging results at 155 °C). But in contrast, the lower the temperature,
the slower diffuses the tin which was deposited with the help of the Organic Metal,
and the slower also it gets oxidized. (Table 6 and fig. 1) It can be seen, that at room
temperature, over one year only 0,29µm tin is being lost compared to 1,46µm tin when
deposited without the Organic Metal (at 155°/4 h, the respective values are 0,60 and
0,68).
After one year, only 0,73 nm SnO and 0,03 nm SnO2 are formed, when tin was
deposited catalyzed by the OM; however, without OM, 17,9 nm and 0,56 nm of these oxides
are formed, parallel with the decrease of solderability. (The respective values at 155°/4
h are 2,36 / 0,91 nm and 2,4 / 1,2 nm.)
Microscopic and SEM studies show, that the OM process results in a highly crystalline tin
surface, whereas the conventional procedure leads to more or less completely amorphous tin
layers. Here we see the reason for a quicker diffusion and oxidation, resulting in a
quicker loss of solderability.
Table 5 Analytical results of various surface finishes
| Finish type | test item | no aging | 155°/4 hrs | 85/85/24 h | steam/8 hrs | 3 reflow |
| Au (NTU) | Oxides wettg force wett angle wave solder |
30 s > 2 48 100% |
100 s > 4 59 45 |
60 s > 4 65 45 |
25 s > 2 93 90 |
60 s > 4 100% |
| Au (CW) | Oxides wettg force wett angle wave solder |
35 s > 2 57 100 |
95 s > 4 56 98 |
60 s > 4 61 100 |
25 s > 2 101 98 |
60 s > 4 90 |
| Ag | Ag [µm] Oxides wettg force wett angle wave solder |
1.75 50 s 4 69 100 |
1.53 > 500 s no wettg > 120 40 |
1.33 200 s > 2 72 98 |
- 85 s > 2 61 90 |
1.81 90 s > 2 98 |
| OSP | Organic layer [µm] Oxides wettg force wett angle wave solder |
17 s > 4 60 100% |
16 s > 500 s 0.4 122 0 |
7 s 200 s > 4 50 45 |
22 s 85 s > 4 47 98 |
0 |
| HASL | Sn [µm] Cu6Sn5 SnO [nm] SnO2 wettg force wett angle wave solder |
1.73 0.78 3.7 0.5 > 2 87 100 |
0.97 1.07 2.1 2.1 > 2 83 100 |
? 0.54 0.5 1.9 > 2 98 100 |
1.56 0.68 2.5 4.5 < 2 (1.79) 84 100 |
0.72 0.73 0.1 0.9 > 2 100 |
| conv immersion tin | Sn [µm] Cu6Sn5 SnO [nm] SnO2 wettg force wett angle wave solder |
0.89 0.3 4 1.5 > 2 83 98 |
0.03 0.48 10.7 5.2 > 2 103 45 |
0.55 0.51 10.8 5.9 > 2 89 100 |
0.77 0.33 4.7 2.8 > 2 84 100 |
0.12 0.86 2.1 5.2 < 2 (1.32) 98 |
| OM / tin | Sn [µm] Cu6Sn5 SnO [nm] SnO2 wettg force wett angle wave solder |
1.07 0.64 1.5 1.2 > 4 78 100 |
0.46 1.22 2.4 0.92 > 4 77 100 |
0.74 0.61 2.6 0.75 > 2 74 98 -100 |
0.98 0.46 1.8 0.84 > 2 71 100 |
0.48 0.91 2.1 1.1 > 2 100 |
| OM / tin new |
wettg force wett angle wave solder |
> 4 30 100% |
>4 45 100% |
> 4 70 à 55 100% |
> 4 100% |
> 4 100% |
Table 6: Tin layer depletion and tin oxide formation upon dry aging
without |
with |
||
| tin layer degradation |
°C | Organic Metal |
Organic Metal |
| k [µm/s1/2] | 50 |
-52 |
-16 |
| *10E-5 | 75 |
-87 |
-45 |
100 |
-233 |
-194 |
|
125 |
-374 |
-303 |
|
150 |
-569 |
-508 |
|
170 |
-818 |
-871 |
|
| extrapolated activation energy [kJ/mol] |
25 |
-25,9 26,3 |
-5,2 39,9 |
| tin oxide | without Organic Metal |
with Organic Metal |
|||
| formation | °C | SnO |
SnO2 |
SnO |
SnO2 |
| [nm/s1/2] | 50 |
525 |
60 |
126 |
34 |
| *10E-5 | 75 |
805 |
65 |
199 |
16 |
100 |
1517 |
152 |
251 |
108 |
|
125 |
2398 |
822 |
789 |
161 |
|
150 |
2036 |
1037 |
1967 |
760 |
|
175 |
3184 |
2518 |
3711 |
1920 |
|
| extrapolated | 25 |
319 |
10 |
13 |
0,5 |
| activation | 17,5 |
39,7 |
41,7 |
61,5 |
|
| energy [kJ/mol] | |||||
New developmental products with Organic Metal catalyzed Immersion Tin
Nevertheless, we have not been content with some aspects of the ORMECON
CSN found in the humid aging. Compared to HASL and Ni/Au, the wetting force and even more
the wetting velocity is not as high after humid aging for the OM catalyzed immersion tin.
As a result of a recent development project, a new modified process was designed leading
to a finish which shows no decrease in the dry aging results, but a significant increase
of the wettability and solderability after humid aging. The wetting balance shows, that
wetting occurs almost instantaneously, at least after 1 or 1.5 sec. Sometimes, wetting was
so quick that the wetting balance apparatus did not reckognise it.
Also solderability under commercial technical conditions has been improved to be now 100%
reliable.First samples in technical scale are under test in facilities of various selected
customers in Europe, Asia and US.
Table 7 Comparison of results for all surface finishes
| wetting force | wave solder | rating |
|||||||||
| finish type | fresh | 155 / 4 h | 85/85 | steam | 3 reflow | fresh | 155 / 4 h | 85/85 | steam | 3 reflow | |
| Au (NTU) | 2 |
4 |
4 |
2 |
4 |
4 |
1.8 |
1.8 |
3.6 |
4 |
25,7 |
| Au (CW) | 2 |
4 |
4 |
2 |
4 |
4 |
3.92 |
4 |
3.92 |
3.6 |
34,4 |
| Ag | 4 |
0 |
2 |
2 |
2 |
4 |
1.6 |
3.92 |
3.6 |
3.92 |
16,7 |
| OSP | 4 |
0 |
2 |
2 |
2 |
0 |
0 |
1.8 |
3.92 |
0 |
4,4 |
| HASL | 2 |
2 |
2 |
2 |
1 |
3.92 |
1.8 |
4 |
4 |
3.92 |
18,8 |
| conv imm tin | 2 |
2 |
2 |
2 |
1 |
3.92 |
1.8 |
4 |
4 |
3.92 |
18,8 |
| OM / tin | 4 |
4 |
2 |
2 |
2 |
4 |
4 |
3.92 |
4 |
4 |
30,4 |
| OM tin new | 4 |
4 |
4 |
2 |
4 |
4 |
4 |
4 |
4 |
4 |
37,6 |
"rating" is the area of the Decaeder formed by the length of 10 axes, having an angle of 36° between each other, representing the values in each different column of the table; the values "wave solder" are generated by dividing the % value by 25
Summary of results
A matrix of final finishes solderability as a function of the various
aging processes has been studied. While the results are not one hundred percent internally
consistent, the trends are unmistakable. Overall, HASL performs very well under dry and
humid aging conditions. Ni/Au also does well except for steam aging. On the average tin
also performs quite well, especially when deposited with the help of the Organic Metal. A
new OM / tin process leads to finish characteristics matching those of HASL. OSP and
Silver, while performing well under humid conditions, are both quite susceptible to poor
solderability when subjected to dry aging. The results are comprised in table 7.